Abstract
The research on power losses of power semiconductor device is necessary for the thermal management system design and evaluation of modern power converters. To obtain the on-state losses, the accurate measurement of on-state voltage is critical. The voltage clamp circuit is usually used to measure the on-state voltage of the device since the on-state voltage is relatively low compared with the off-state voltage. The work safety, measurement accuracy, and measurement delay time of conventional voltage clamp circuits cannot fully meet the requirements of power losses calculation. To measure the on-state losses more accurately, this paper proposes an optimized voltage clamp circuit. Compared with the conventional course, the new circuit makes two optimizations that remove anti-parallel diodes and remove power source output capacitor, respectively. Then, the two optimization methods are analyzed in detail. Finally, a voltage clamp circuit test platform is built to test the performance of the optimized circuit. The experimental results show that the safety and accuracy of the on-state voltage measurement are obviously improved.
Published Version
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