An Open-Circuit Faults Diagnosis Approach for Three-Phase Inverters Based on an Improved Variational Mode Decomposition, Correlation Coefficients, and Statistical Indicators

Abstract

To ensure the reliability and robustness of the three-phase inverter, it is important to accurately detect the faults of insulated gate bipolar transistor (IGBT) switches. Signal processing is widely used for monitoring and fault diagnosis of the three-phase inverters. The current signals are usually noisy, which can lead to a loss of fault information. This article proposes a new approach for identifying and detecting the IGBTs open-circuit faults of a three-phase inverter. This approach is based on an improved version of the variational mode decomposition (IVMD) technique associated with correlation coefficients and statistical indicators (variance and mean value). First, the IVMD is applied to the three-phase current signals to obtain an elementary function called the band-limited intrinsic mode functions (BLIMFs). Second, the correlation coefficients between the original signals and theirs BLIMFs are used to select the relevant modes. The variances of the modes that have the highest correlation coefficients among those selected are calculated to detect the faulty phase and, therefore, the faulty leg. Finally, the mean value of the mode that has the lowest correlation coefficients among those selected of the faulty phase is calculated to localize the fault position in either the upper or the lower IGBTs of the faulty leg. Different experimental data are used to test the effectiveness of the proposed approach. The results obtained show the merits of the proposed approach for the diagnosis and detection of open-circuit IGBTs compared to the conventional method.