Abstract
The magnetic properties of MgO thin films were discussed as an interplay among the oxygen vacancies, Mg2+ ion coordination and structural order deposited using radio frequency (RF) sputtering method by varying substrate temperature and deposition power followed by in-situ annealing. Rutherford backscattering spectrometry (RBS) and high resolution transmission electron microscopic (HRTEM) performed for these films showed decrease of film thickness with increase of substrate temperature. Films are thicker for higher sputtering powers at corresponding substrate temperatures. Spectral features in Mg K-edge near edge X-ray absorption fine structure (NEXAFS) spectra are characteristics of MgO for both sputtering powers at substrate temperature of room temperature (RT) and 350 °C. O K-edge NEXAFS spectra exhibited onset of oxygen vacancies as inferred from pre-edge region. Magnetization versus applied magnetic field curves for these films showed onset of do ferromagnetism. This behavior ceased with increase of substrate temperature, however, become dominant with increase of sputtering power. Magnetic behavior was dominant for the films which had slightly distorted Mg2+ ion co-ordination. The existence of oxygen vacancies was not observed to be consistent with magnetization. Thus, this study envisaged the role of Mg2+ ion coordination, long range structural order and oxygen vacancies in order to determine magnetism in these systems.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.