An Improved Weighted Average Method for Test Data Analysis of Electronic Components

Abstract

Electronic components are the basis of electronic equipment, and their reliability and lifetime have a direct impact on the work efficiency of the whole electric system. In fact, the test data on life characteristic parameters (LCP) of electronic components present random fluctuations because of the existence of some disturbing factors in the process of life test. This will bring great obstacles to the study on the rules of LCP, the reliability and life forecasting of electronic components. In order to solve these problems, this paper proposes a method of the determination of weight coefficients and an improved weighted average algorithm to reveal the rules of LCP. In the improved weighted average algorithm, the latest data is constantly introduced while the oldest data is removed. By an example of contact bounce time on electromagnetic relay, the application verification has been carried out on the above-stated method in the paper. The results show that the method is effective and feasible.