Abstract
This paper verified through experiments that change in ambient temperature are the main cause of dark output noise drift. Additionally, the impact of dark output noise drift in fiber optic spectrometers on emissivity measurements has been investigated in this work. Based on an improved fiber optic spectrometer, two methods were proposed for characterizing and correcting the dark output noise offset in fiber optic spectrometers: the mean correction scheme and the linear fitting correction scheme. Compared to the mean correction scheme, the linear fitting correction scheme is more effective in solving the problem of dark output noise drift. When the wavelength is greater than 1600 nm, the calibration relative error of silicon carbide (SIC) emissivity is less than 0.8% by the mean correction scheme, while the calibration relative error of silicon carbide emissivity is less than 0.62% by the linear fitting correction scheme. This work solves the problem of dark output noise drift in prolonged measurement based on fiber optic spectrometers, improving the accuracy and reliability of emissivity and quantitative radiation measurement.
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