Abstract

Publisher Summary The performance and density of the charge-coupled device (CCD) image sensor have been significantly improved. The appearance of the long linear array, having 7 × 7 μm 2 photosites with 4096 elements, is particularly promising. This type of image sensor has a very high spatial resolution, which is achieved by the use of bilinear or even quadrilinear shift registers. Linear sensors using improved 1728-element, 2438-element three-phase surface channel CCDs (SCCD) and a buried channel CCD (BCCD) have been successfully fabricated. These devices can be used primarily for producing facsimiles, remote sensing, and telemetering at higher resolution, as well as for noncontacting size measurement. Thus, the dual line signal is directly combined in one line output so that the device structure and driving circuitry are very simple. It has been found that signal-level differences between the odd and even dual lines can be adjusted nearly to zero.

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