Abstract
The present paper is dedicated to studying the accuracy of sample material parameter reconstruction using terahertz (THz) pulsed spectroscopy. The technique for characterizing the material parameters of thin flat samples allowing to take into account multiple wave reflections in a flat have been considered. While transmitting through the resonant sample, THz pulse undergoes multiple reflections, which result in satellite pulses in THz waveform. The accuracy of material parameter reconstruction strongly depends on the number of satellite pulses. We have analytically estimated an impact of satellite pulses on material parameter reconstruction by considering the local linearization of theoretical sample transfer function based on the model of quasi-Fabry-Perot-resonator.
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