Abstract
This paper presents new experimental and theoretical results for the material parameter reconstruction utilizing the terahertz (THz) pulsed spectroscopy (TPS). The material parameter reconstruction algorithm was realized and experimentally implemented to study the test sample. The algorithm takes into account multiple reflections of THz pulse within the flat sample during the transmission mode measurements. Therefore the samples with small thickness or low refractive index could be studied utilizing the proposed method. In order to estimate the reconstruction accuracy, test sample material parameters, obtained with the TPS, were compared with the results of the same sample studying by the use of the backward-wave oscillator (BWO) spectroscopy. Thus, high reconstruction accuracy was demonstrated.
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