Abstract
A simple and compact electrostatic quadrupole triplet lens has been designed and fabricated as part of the dedicated beam line for analysis of archaeological samples. A Fortran based ion optics program has been developed to simulate the beam line and lens parameters to achieve a focused sub-millimeter beam spot. The results of simulations are utilized to design and fabricate beam-line elements. The beam spot was measured by wire scanning method to be 0.3 mm for the object-slit width of 1 mm at a distance of 15 mm from the exit window. The improved Ion Beam Analysis setup allows accelerated PIXE analysis of samples whose details are comparable with the beam probe in size. The PIXE spectrum obtained by external analysis of a historical enameled ceramic sample with a sub-millimeter beam is compared with that obtained by in-vacuum standard PIXE analysis.
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