Abstract
The image quality of laser and multi-function printers that make use of electrophotography depends on the amount of surface charge generated by contact electrification on the toner particles. However, because it has been impossible to experimentally evaluate such amounts under controlled contact conditions using macroscopic measurements, theoretical elucidation of the contact electrification mechanism has not progressed sufficiently. In the present study, we have developed a system to experimentally evaluate the contact electrification of a single particle using atomic force microscopy (AFM) and nanotweezers (microelectromechanical systems (MEMS)-based actuated tweezers). This system performs, in succession, (i) a contact test that makes use of the nanotweezers and three piezoelectric stages, and (ii) an image force measurement using the AFM cantilever. Using this system, contact electrification was evaluated under controlled conditions, such as the contact number and the indentation depth. In addition, differences in contact electrification due to the amount of external surface additives were investigated. The results reveal that a coating with external additives leads to a decrease in the amount of contact electrification due to a reduction in the contact area with the substrate.
Highlights
Electrophotography-based laser and multi-function printers have primarily been used for general document printing in offices
TheThe amount of charge generated during thethe contact testtest cancan be be calculated from thethe image force, amount of charge generated during contact calculated from image force, which is obtained by multiplying the deflection and the spring constant the cantilever
We proposed a novel measurement technique for evaluating the electrification characteristics of a single microparticle under controlled contact conditions
Summary
Electrophotography-based laser and multi-function printers have primarily been used for general document printing in offices. Sun et al reported that the charge generated by friction between a cantilever and SiO2 substrates under different load conditions can be observed using AFM. These studies were advanced in that charged states could be reproducibly generated and evaluated, the evaluation was limited to contact charging between the tip material of the cantilever and the sample. We present a unique method for evaluating the contact electrification of a single the charge obtained by our method is linearly correlated with that obtained using the conventional particle using nanotweezers (microelectromechanical systems (MEMS)-based actuated tweezers) blow-off method. 2. Materials and Methods involves picking up a particle, conducting a contact test between the particle and a substrate, shows the system for evaluating single-particle contact electrification. (a) Picking up a toner particle; (b) Contact test; (c) Image force measurement
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