Abstract
Ion desorption induced by core-electron transitions is studied for various surfaces by electron-ion coincidence spectroscopy combined with synchrotron radiation. In a study of F+ desorption from Si(100) terminated by fluorine using photoelectron photoion coincidence spectroscopy, the site-selective F+ desorption is directly verified; that is, F+ desorption is induced by Si 2p photoionizations at the ≡SiF, =SiF2, and –SiF3 sites. An Auger electron photoion coincidence study of a CaF2(111) film epitaxially grown on a Si(111) surface also presents direct evidence of F+ desorption, in this case induced by F 1s surface core exciton. These investigations demonstrate that electron-ion coincidence spectroscopy combined with synchrotron radiation is a powerful tool for studying ion desorption induced by core-electron excitations.
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