Abstract
The molecular structure of F 3SiNCO has been determined in the vapour phase by the sector microphotometer method of electron diffraction. The data are consistent with an Si-N-C angle of 160.7±1.2°, and Si-F and Si-N bond lengths of 1.553±0.004 and 1.648±0.010 Å respectively; the N-C and C-O bond lengths are strongly correlated with each other. The problems of interpretation of the electron diffraction structure are discussed in the light of a possible low Si-N-C deformation frequency.
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