Abstract

In this paper, the crosstalk effects in coupled multiwalled carbon nanotube (MWCNT) interconnects have been analyzed. An unconditionally stable finite-difference time-domain (USFDTD) technique has been used for the crosstalk model. The in_phase delay, out_phase delay, and crosstalk noise for coupled interconnect lines have been determined. It is observed that crosstalk effect is less severe in MWCNT interconnects compared to the conventional copper interconnects. The results of the proposed model have been verified with the conventional FDTD technique, hailey simulation program with integrated circuit emphasis (HSPICE), and feature selective validation. For transient analysis, the proposed model on an average consumes 46% lesser CPU runtime as compared to the conventional FDTD technique. Further, stress and electro-migration effects have been analyzed for copper and MWCNT interconnects. The mean time to failure of MWCNT interconnects is found to be superior than that of copper interconnects.

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