Abstract
Current–voltage (IV) characterization is the most fundamental measurement performed on solar cells. This measurement is commonly used to extract basic solar cell parameters, such as open circuit voltage, short circuit current density, fill factor, and power conversion efficiency. We were able to obtain a fast tool to find defective behavior using Simulation Program with Integrated Circuit Emphasis simulations and generate an understanding of which device property can create such defective behaviors by analyzing the second derivative of IV curves.
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