Abstract
Current–voltage (IV) characterization is the most fundamental measurement performed on solar cells. This measurement is commonly used to extract basic solar cell parameters, such as open circuit voltage, short circuit current density, fill factor, and power conversion efficiency. We were able to obtain a fast tool to find defective behavior using Simulation Program with Integrated Circuit Emphasis simulations and generate an understanding of which device property can create such defective behaviors by analyzing the second derivative of IV curves.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
