Abstract

This paper proposed a kind of guard traces based on a subwavelength periodic structure to reduce the far-end crosstalk (FEXT) of parallel microstrip lines in the PCB. This technology can be used to improve the false triggering and signal transmitting capacity of a multiconductor transmission line circuit system. In order to explore the present novel guard trace effect on isolating electromagnetic interference (EMI), the frequency response of the mutual capacitance and mutual inductance of the overall circuit system was provided and an equivalent circuit model was built. In comparison to the conventional microstrip line for isolating the EMI between parallel microstrip lines, the novel guard trace can efficiently reduce the mutual capacitance and mutual inductance of the overall circuit system. Thus, it is favorable for suppressing the crosstalk between microstrip lines. The <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$S$ </tex-math></inline-formula> -parameters calculation result showed that this kind of subwavelength periodic microstrip guard trace can isolate the EMI between two microstrip lines more effectively. Particularly, the conventional grounded guard trace needs a lot of dense grounded holes, which severely influences the wiring design of various layers of a multilayer circuit board. However, the proposed guard trace requires only one grounded hole, which has little influence on the circuit wiring of each layer of a multilayer printed circuit board. In our experiment, the step function signal of 30 ps rise time was imported into one microstrip line to measure the FEXT of the other microstrip line. It was demonstrated by the measurement result that the subwavelength periodic microstrip guard trace can reduce the FEXT to be below 5% of the transmission signal amplitude and is more flexible in practice. In compliance with the actual demand for a high-speed circuit, three isolation structures were proposed, and their isolation effects on the electromagnetic coupling between microstrip lines were verified individually.

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