Abstract
Conventionally, the polarization of a synchrotron soft X-ray beam is measured through a polarimeter based on multilayer optical elements. The major drawback of the traditional approach is the difficulty in comparing different configurations due to the misalignment of each incident angle. In this paper, a new analytical model, based on the variation of reflectivity for different incident angles, is established to facilitate the extraction of important polarization-related information, i.e. angular distribution of polarization components, a tiny change of the direction of azimuth rotation axis of polarizer, etc.
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