Abstract
This paper gives an in-depth analysis of the factors affecting the alpha parameter which is used for extracting the surface recombination velocity in electron beam induced current (EBIC) line scan measurements. The analysis shows that the alpha versus normalized surface recombination velocity curve is a function of both the normalized beam depth as well as the normalized scanning range. Variations in the normalized beam depth affect the accuracy only when extracting high surface recombination velocity values. On the other hand, the variation in the normalized scanning range affects the accuracy in extracting the middle range values of the surface recombination velocity only slightly. Conditions for accurate extraction are given in this paper. The analysis was further verified with the use of computer simulation.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
