Abstract
An amorphous silicon linear sensor originally manufactured for facsimile has been applied to imaging systems for industrial nondestructive testing and radiography. X-ray images can be measured by scanning of a single linear sensor with a Gd 2O 2S phosphor sheet set on a sliding stage. To reduce the exposure time a semi-area detector with 16 linear sensors has been also constructed. The spatial resolution of 2.5 line pair/mm was obtained for X-ray images with an area of 30 × 25 cm 2.
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