An alternative test method for the dual-port SRAM through the DesignWare SATA AHCI implementation in 3D IC structures

Abstract

The conventional methods for testing the Dual Port Random Access Memories (DPRAM) may not be suitable for the Three-Dimensional Integrated Circuit (3D IC) structures, due to their limited test vectors with heterogeneous integration. This paper takes an Application Specific Integrated Chips (ASIC) approach to gain some insight into the Front-end behavioral testing and backend routability of the dual port memories with complex Serial Advanced Technology Attachment (Serial-ATA) design, in a 3D IC structure. The presented implementation used commercially available Dual Port memories from the two different vendors. The commercially available DesignWare Advanced Host Controller Interface (SATA/AHCI), which is based on the SATA 2.6 AHCI host and external SATA (eSATA) standard bus architecture, with My_foundry’s 14 nm low power process (14lp) technologies for the logical and physical implementations. The methodology evaluates the memory quality and performance/characteristics, in terms of timing, power and area. This paper shows memory testing in both implementation/verification in a readily built-up SATA test environment.