Abstract
This paper embeds a “phase-reset” scheme into a bang-bang clock and data recovery (CDR) to periodically realign the clock phase to the data rising edge using a gated-VCO. This reduces both the CDR lock time and bit errors during pull-in, while increasing the CDR capture range. The CDR is fabricated in 65-nm CMOS, operates at 8-11 Gb/s, and demonstrates a 9 × increase in capture range. The CDR consumes 84 mW during lock, and 48 mW in steady state.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: IEEE Transactions on Circuits and Systems I: Regular Papers
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.