Abstract
All the terms contributing to the dark current for an n-amorphous/ p-crystalline silicon heterojunction have been evaluated. The abrupt heterojunction model with the presence of interface states has been adopted and flat quasi-Fermi levels have been assumed across both depletion regions. The gap density of states in amorphous silicon has been approximated by a V-distribution. The dominant current mechanisms at forward and reverse biases have been determined and the zero-bias spectral response has been calculated.
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