Alkaline‐developable and negative‐type photosensitive polyimide with high sensitivity and excellent mechanical properties using photo‐base generator

Abstract

AbstractAn alkaline developable and negative‐type PSPI with a high sensitivity and excellent mechanical properties based on a poly(amic acid) (PAA) and a photo‐base generator has been developed. The PAA was prepared by the polycondensation of p‐phenylenediamine (PDA) with an equimolar of 3,3′,4,4′‐biphenyltetracarboxylic dianhydride (BPDA) and 4,4′‐(hexafluoroisopropylidene)diphthalic anhydride (6‐FDA) and converted thermally to the corresponding polyimide, PI(PDA‐BPDA/6‐FDA). PI(PDA‐BPDA/6‐FDA) showed the high thermal and mechanical properties and the dimensional stability such as the thermal decomposition temperature of 530°C, glass transition temperature of 369°C, linear coefficient of thermal expansion of 28 ppm/K, ultimate tensile strength of 148 MPa, elongation at break of 25% and dielectric constant of 2.8. The PSPI was formulated directly from PAA(PDA‐BPDA/6‐FDA) with a photo‐base generator (PBG), (E)‐3‐(2‐hydroxy‐4‐methoxyphenyl)‐1‐(piperidin‐1‐yl)prop‐2‐en‐1‐one (HMPP) (10 wt% to PAA) and the optimized parameters for photolithographic process were investigated including the PBG content, post‐exposure bake (PEB) temperature, and PEB time. The PSPI based on PAA(PDA‐BPDA/6‐FDA) and HMPP (10 wt% to PAA) showed a sensitivity of 114 mJ/cm2 and contrast of 1.29 when exposed to 365‐nm light (i‐line), post‐exposure baked at 160°C for 5 min, and developed with an aqueous solution of 2.38 wt% tetramethylammonium hydroxide and iso‐propanol. A clear negative 8‐μm features pattern was obtained by contact‐printing and converted into the PI pattern upon heating at 250°C, confirming by scanning electron microscopy and infrared spectroscopy.