Abstract
The BiFe0.95Mn0.05O3 (BFMO) thin films were epitaxial grown on the SrRuO3/LaAlO3 (SRO/LAO) single crystal substrates with different orientations (<100 >,<110 >and<111 >) by sol-gel and layer-by-layer rapid thermal annealing methods, respectively. The test techniques including X-ray diffraction (XRD), Raman, high resolution field emission scanning electron microscope (HR-SEM) and atomic force microscope (AFM) were applied to analyze the structure of the film samples. The results showed that a two-phase coexistence structure grown in all three films with the rhombohedral R3c as the main phase and the orthogonal Pnma as the second phase. The PFM tests revealed that the <111> oriented sample had normal island domain configuration, while the <100> and <110> oriented samples mainly grew non-180° domains. By comparing the aging behavior of the three samples after a room temperature period of aging for 30 and 120 days, it was believed that the film samples with different orientations appeared distinct aging degrees due to the different number of polarized equivalent components along <111> direction and the different angle between the equivalent components and the applied electric field direction. In particular, the film sample with <111> orientation showed almost no aging. It was also believed that the defect dipole pinning happened in the ferroelectric domain bodies would play a leading role in the aging process.
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