Abstract
Since the invention of the integrated circuit (IC) in 1959, there has been an enormous growth in performance and complexity of electronic systems by drastically reducing the basic building blocks and increasing the circuit density. Due to this ongoing miniaturization of microelectronics, new physical mechanisms can be triggered or known physical mechanisms can be enhanced inducing ageing and failure of the electronic material systems. The time evolution of these ageing mechanisms has to be understood in order to guarantee the lifetime of several years required for products such as personal computers, automobiles, home appliances etc. The study of failure mechanisms in electronic components requires a combination of advanced electrical, analytical and statistical tools.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
