Abstract
The dependence of the surface morphology of triphenyldiamine derivative (TPD) thin films on the deposition rate was observed by atomic force microscopy (AFM). Moreover, electroluminescent (EL) properties as a function of the TPD deposition rate were also measured. It was found that a deposition rate of around 3 Å/s is the optimum for the flatness of the films and EL properties.
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