Abstract
The use of zinc triflate (trifluoromethanesulfonate), [Zn(OTf)2] as a precursor in the aerosol assisted chemical vapour deposition of zinc oxide thin films is described. Aluminum doped zinc oxide (AZO) thin films are also shown to be deposited when aluminum acetylacetonate [Al(acac)3] was introduced into the precursor solution, illustrating the versatility of this system. Film characterization techniques include glancing angle X-ray powder diffraction, X-ray photoelectron spectroscopy, scanning electron microscopy and optical and electrical measurements. AZO films with an Al content of 7at.% were found to have favourable transparent conducting oxide properties with simultaneous high transparency (>80%) in the visible light region and a low electrical resistivity (1.96×10−3Ωcm).
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