Abstract
Abstract X-ray photoelectron spectroscopy (XPS or ESCA) has reached a state of maturity in which some of its common uses may be considered routine. There is a danger, however, in the possible over-interpretation of this status. (Consider, for example, the hundreds of incorrect ESCA analyses in high Tc superconductivity.) Thus, although recent advances in instrumentation have simplified general operations, they have also clearly identified a variety of previously undetected or misunderstood features in the technique that seem to suggest the potential of a more powerful analysis tool. These new areas require a much more sophisticated understanding of the photoelectron process and its potential uses. In the present article we provide a description of the background, present status, and possible future uses of some of these features of photoemission spectroscopy, including: (1) the charging shift and Fermi edge referencing, (2) valence band analysis, (3) XPS induced loss spectroscopy, (4) surface-to-bulk chem...
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