Abstract
Various applications of X-ray photoelectron spectroscopy (XPS) for carbon fiber are described. Carbonization process on surface of fiber is tracked by XPS as variation of elemental composition and also of chemical species revealed by chemical shift in XPS spectra as shown in Fig. 2. Surface oxidation and also high temperature treatment of carbon fiber are also examined as shown in Table 3. Chemically heterogeneous structure of carbon fiber is studied by XPS depth profiling by utilising an Ar + etching gun as shown in Fig. 7.
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