Abstract

This chapter comprises the review of new methods of phase triangulation, which allow 3D geometry measurements under the conditions of arbitrary measured object surface light-scattering properties, varying measurement setting external illumination, and limited depth of field of optical elements of the source and receiver of optical radiation. The application of the proposed methods provides higher metrological characteristics of measuring systems and expands the functionality and the range of application of optical-electronic systems for geometric control in the production environment.

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