Abstract
This article reports recent developments in modelling based on Finite Difference Time Domain (FDTD) and Finite Element Method (FEM) for dielectric resonator material measurement setups. In contrast to the methods of the dielectric resonator design, where analytical expansion into Bessel functions is used to solve the Maxwell equations, here the analytical information is used only to ensure the fixed angular variation of the fields, while in the longitudinal and radial direction space discretization is applied, that reduced the problem to 2D. Moreover, when the discretization is performed in time domain, full-wave electromagnetic solvers can be directly coupled to semiconductor drift-diffusion solvers to better understand and predict the behavior of the resonator with semiconductor-based samples. Herein, FDTD and frequency domain FEM approaches are applied to the modelling of dielectric samples and validated against the measurements within the 0.3% margin dictated by the IEC norm. Then a coupled in-house developed multiphysics time-domain FEM solver is employed in order to take the local conductivity changes under electromagnetic illumination into account. New methodologies are thereby demonstrated that open the way to new applications of the dielectric resonator measurements.
Highlights
With rapid progress in developing organic and inorganic materials, it becomes more important to determine the quality and performance of the manufactured products alongside with their reproducibility and repeatability in terms of characteristic parameters
We have focused on the fundamental mode without any sample to cross verify and compare our FD-Finite Element Method (FEM) and Finite Difference Time Domain (FDTD) approaches
We have focused on the split-post dielectric resonator (SPDR) test-fixture, which is representative due to its broad use in different industrial applications [8,9] combined with reference accuracy [14]
Summary
With rapid progress in developing organic and inorganic materials, it becomes more important to determine the quality and performance of the manufactured products alongside with their reproducibility and repeatability in terms of characteristic parameters. These strongly depend on materials’ chemical composition, which often reveals itself directly in electromagnetic properties. The electromagnetic waves have been used for material characterization under various settings. Whereas the scanning microwave microscopy (SMM) techniques make it possible to quantitatively characterize, analyze, and categorize materials at microwave frequencies [1,2,3,4,5,6], in parallel, microwave resonator techniques are developed, which focus on pure electromagnetic characterization at bulk level. The split-post dielectric resonator (SPDR) has been accepted
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