Abstract
High band-gap semiconductor materials can represent good alternatives to silicon in relative dosimetry. Schottky diodes made with epitaxial n-type 4 H SiC and Chemical Vapor Deposited diamond films with ohmic contacts have been exposed to a 60Co γ-source, 20 MeV electrons and 6 MV X photons from a linear accelerator to test the current response in on-line configuration in the dose range 0.1–10 Gy. The released charge as a function of the dose and the radiation-induced current as a function of the dose-rate are found to be linear. No priming effects have been observed using epitaxial SiC, due to the low density of lattice defects present in this material.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
