Abstract

The adhesion strength of sputtered copper films to chemically etched nickel substrates has been studied using the scratch adhesion test. The effects of the concentration and the temperature of a nitric acid bath were investigated and it was found that the critical load was very weak unless the amorphous layer produced by mechanical polishing on the substrate surface was eliminated. A chemical etching at room temperature in a nitric acid bath was shown to have only a slight efficiency in the enhancement of the adhesion, whatever the bath concentration was. High critical loads could be obtained when the temperature of the bath was increased to 80 °C. Above this temperature, the critical load enhancement was largely lost. At room temperature, the addition to the bath of small quantities of nickel sulphate (1 gl −1) gave a strong increase in the values of the critical load. A larger addition of sulphate led to poorer results. The roughness of the etched surface was measured with a profilometer and observations were made by scanning electron microscopy. It was observed that, as a general rule, the critical load increases with increasing surface roughness. However, a very important factor in the adhesion strength seems to be the morphology of the surface.

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