Abstract
Three-dimensional (3D) shape measurement of shiny surfaces poses significant challenges to the optical metrology community. This paper presents a design of an adaptive binary stripe pattern in 3D shape measurement of shiny surfaces. In order to make the decoding procedure more robust, and to improve the measurement resolution as well, a stripe-shifting pattern and sub-pixel center detection of a light stripe are applied. By adaptively adjusting the pixel-wise intensity of the projected stripe patterns, it can avoid image saturation and maintain high signal to noise ratio. Thus, high quality stripe pattern images can be obtained. Experimental results demonstrate that the proposed adaptive binary stripe pattern can handle shiny surfaces in 3D shape measurement.
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