Abstract
A phenomenological model describing the non-Arrhenius behavior of glassy dielectrics is presented. It shows the significant influence of activation entropy on the α relaxation of several dielectrics. Below the Arrhenius regime, there is very little free volume left and new configuration sites are needed. The associated configuration entropy is inversely proportional to an additional activation entropy leading to apparent activation entropy continuously varying with the temperature. A simple empirical method is proposed to estimate the additional activation entropy and the number of basic units involved in the relaxation. This number determined under atmospheric pressure is in good agreement with the activation volume cited in the literature. A relation between the relaxation free energy, the number of configurations and fragility is briefly discussed.
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