Abstract
Accurate phase measurement of structured light is highly desirable in holographic optical tweezers, since quality of phase profiles have a strong impact on performance of manipulating particles. Here, we report a novel interferometric phase measurement technique for accurately measuring phase profile of structured light. The related experiments are performed, in which the measured phase profiles agree well with the designed phase profiles. It reveals that the phase profiles of structured light can be accurately obtained. Importantly, the fast switch between phase measurement and particle manipulation in the experiment can be easily implemented, which are strongly preferable in holographic optical tweezers. This study offers a promising way for accurately obtaining phase profiles of structure light, which is very helpful for particle manipulation.
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