Abstract
An improved image type sapphire resonator was developed for accurate measurement of surface resistance of a single piece of high temperature superconductor thin film. The surface resistances of two DC spurting yttrium-barium-copper oxide (YBCO) thin films were measured by TE <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">011</sub> mode of this resonator. TE <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">012</sub> mode of this resonator was also used in the measurement for the determination of the frequency dependence of the surface resistance of the HTS thin film. The high accuracy in the R <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">s</sub> measurement of this resonator is comparable to the one of conventional two-resonator method, while the process is much simpler. The ability for measuring surface resistance of a single HTS thin film and characterizing the frequency dependence of R <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">s</sub> of this sapphire resonator is remarkable.
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