Abstract
A novel method for microwave surface resistance measurement of high temperature superconductor thin film at multi-frequency by multimode of sapphire rod is introduced. This method has the advantages of high sensitivity and large dynamic range of the measurement. By using this method, the frequency dependent microwave surface resistance of a single piece of high temperature superconductor thin film can be characterized within one temperature cycle. This method is capable of reducing the amount of work in surface resistance measurement and providing supports to the research and the industrialization of high temperature superconductor thin film.
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