Abstract
A modified thickness fringe method is proposed for the determination of a low-order Fourier coefficient of the crystal potential. This method can be applied not only to single crystals with perfect wedge shape but also to those with some irregularities by introducing a `surface function', which can automatically correct the irregularity of the fringe periods due to the wedge surfaces. Electro-thinned aluminium single crystals are used as a reference substance in experiments with and without a filter technique. Comparison of the experimental data with n-slice calculations can give the coefficient with an error of less than 1 percent.
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