Abstract
We present a method for accurately de-embedding the electrical effects of the bias and measurement electrode structure used for spin-torque oscillator (STO) measurements. We propose a simple, but very accurate, method that requires only one additional test structure per STO wafer. We show that the effects of the electrode structure, including phase shift over frequency and insertion loss, can be removed, providing an accurate measurement of the true STO parameters. Our method is verified using 24 STOs across four different wafers each containing 140 STOs.
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