Abstract
We report on a technique for accurately π/2-phase shifting a stabilized interference pattern of light fringes used for building up a map of phase for 2D deformation measurement. This technique is based on the use of low amplitude phase modulation on the setup in order to generate first and second harmonics temporal terms in the pattern of light to operate an actively stabilized setup. Particular features of this stabilization setup allow one to use them for accurate π/2-phase shifting with the practical advantage of operating on an already stabilized pattern of fringes.
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