Single fringe projection profilometry based on sinusoidal intensity normalization and subpixel fitting

Abstract

A novel fringe projection profilometry using a single sinusoidal fringe pattern projected is proposed. Computer-generated sinusoidal fringe and uniform intensity patterns are firstly projected on a testing object by a liquid crystal display projector. The variable reflection intensity of a fringe pattern is then roughly normalized by division operation applied to the grabbed fringe and uniform intensity patterns projected. Fringe intensity is further normalized by employing an interpolation algorithm. The deformed sinusoidal pattern encoding object shape is converted to a wrapped phase map without using phase-shifting or Fourier transform. Computer simulation and experimental performance are evaluated to demonstrate the validity of the proposed method. The experimental results compared with those of the four-step phase-shifting and fast Fourier transform methods are also presented.