Abstract
A novel fringe projection profilometry using a single sinusoidal fringe pattern projected is proposed. Computer-generated sinusoidal fringe and uniform intensity patterns are firstly projected on a testing object by a liquid crystal display projector. The variable reflection intensity of a fringe pattern is then roughly normalized by division operation applied to the grabbed fringe and uniform intensity patterns projected. Fringe intensity is further normalized by employing an interpolation algorithm. The deformed sinusoidal pattern encoding object shape is converted to a wrapped phase map without using phase-shifting or Fourier transform. Computer simulation and experimental performance are evaluated to demonstrate the validity of the proposed method. The experimental results compared with those of the four-step phase-shifting and fast Fourier transform methods are also presented.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
