Accelerated computation of admittance parameters for planar waveguide junctions

Abstract

Admittance parameters are widely employed to characterize the electromagnetic behavior of arbitrary planar waveguide junctions. Even though strong efforts have been devoted to the development of simple and efficient procedures for evaluating such parameters, it is still very important to further reduce the computation time required when analyzing waveguide systems as they become more complex. This article describes a simple and very fast procedure for computing the admittance parameters of planar waveguide junctions. The key feature of this procedure is that the frequency dependence of the admittance parameters is extracted from all infinite sums. As a result, only a few terms need to be evaluated at each frequency point thereby substantially reducing the computational effort. © 1997 John Wiley & Sons, Inc. Int J Microwave Millimeter-Wave CAE 7: 195–205, 1997.