AC-dielectrophoretic force assisted fabrication of conducting quantum dot aggregates in the electrical breakdown-induced CNT nanogap

Abstract

In this paper, we fabricated quantum dot (QD) aggregates at desired locations using dielectrophoretic (DEP) forces induced in the carbon nanotube (CNT) nanogap created by Joule heating-induced electrical breakdown. Nanogaps with a size of at least 20–30 nm can be effectively fabricated in the ambient condition, and fabrication yield can be monitored through in-situ electrical signal without post morphological analysis. The geometry of CNT electrodes with high aspect ratio as well as the gap size of the electrodes to a few tens of nanometers scale enabled the derivation of sufficiently high DEP forces that facilitate the trapping of QD in the CNT nanogap. Above all, we were able to fabricate a conducting crack-free QD aggregates by exchanging the ligands on the surface of the QDs in the presence of a DEP force and this approach showed the possibility of being applied as a QD based optoelectronic devices.