Abstract
Abstract Here, the development of new chalcogenide glassy system has been reported. The AC conductivity and dielectric behaviour of them have been studied. X-ray diffraction (XRD) has been used as probe to reveal microstructure of them. Almond-West Formulism and Electric modulus formalism have been employed to interpret AC conductivity data and to explore their dielectric behavior respectively. Structural parameter (β) and dislocation density of them have been estimated to interpret electrical measurements data.
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