Abstract
AbstractX‐ray absorbance depends on the wavelength of the X‐rays, atomic number, chemical environment, and concentration of analyte. X‐ray absorption spectrometry is a technique for analyzing the chemical environment of an element in an unknown material. This method is closely related to photoelectron spectroscopy, Auger electron spectroscopy, and X‐ray fluorescence spectroscopy.Chemical information in the chemical shift and line shape of XANES (X‐ray absorption near‐edge structure) spectra is described. The history and theory of EXAFS (extended X‐ray absorption fine structure) are discussed in relation to other experimental techniques. Data analysis methods, databases, software packages, instrumentation, and synchrotron radiation facilities for X‐ray absorption analysis are overviewed. Alternative methods such as electron energy loss spectroscopy (EELS), self‐absorption effect, extended X‐ray emission fine structure (EXEFS), X‐ray Raman scattering, diffraction anomalous fine structure (DAFS), β‐environment fine structure (BEFS), and inverse photoemission spectroscopy (IPES) are also described.
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