Abstract
Silicon K X-ray fluorescence spectra of soil samples in a volcano island are measured using a commercially available wavelength dispersive X-ray fluorescence spectrometer for elemental analysis. EXEFS (extended X-ray emission fine structure) are found at the low energy side of the K X-ray fluorescence diagram lines. Synchrotron radiation XANES (X-ray absorption near edge structure) spectra are measured for the same samples and for aerosols collected in the same island. The EXEFS spectra are compared with the XANES spectra. The EXEFS method becomes an easy-to-perform alternative of XANES measurements using a similarity between EXEFS and XANES. We analyze the chemical state of Si in the soil samples.
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