Abstract
Using the density-functional-theory based ab initio method, the authors determine the Ehrlich–Schwoebel barrier as a function of step thickness. The prototype material system is a Cu⟨110⟩ step of B type on a {111} surface. The calculation results show that the diffusion barrier of an adatom is 0.06eV on a flat Cu{111} surface, 0.16eV down a monolayer step, 0.39eV down a two-layer step, and 0.40eV down a multiple-layer step. The results, particularly the transition from 0.16to0.40eV, will have major impacts on the design of surface facets during synthesis of thin films and nanorods.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have