A Zero-Timing Overhead SET Mitigation Approach for Flash-based FPGAs

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Reliability of Integrated Circuits (ICs) is nowadays a major concern for sub-micron technologies especially when they are adopted in mission critical applications. The decreasing of device feature size leads to an increasing of the device sensitivity against Single Event Effects (SEEs), especially Single Event Transients (SETs), induced particle strikes within the device silicon structure. Flash-based FPGA is a golden core for aerospace safety critical applications; however, traditional SET mitigation solutions, such as filter insertion, can lead to performance degradation of the implemented design. In this paper, we provide a new implementation flow that is able to evaluate the SET phenomena considering its specific convergence case and effectively mitigate the SETs without introducing any performance penalization to the original netlist. Experimental results on different sets of benchmark circuits demonstrated the mitigation of SET events without affecting the timing performances of the circuits.