Abstract
The various formulations of the technical diagnostics problem are possible when creation and use of analog circuits. One approach allows deviation a sufficiently large set of the elements parameters. The results of this diagnosis can be used to improve the technology of analog circuits or predict their behavior depending on the time of exposure or destabilizing factors. The power sources (current sources and emf) commonly used as a testing influence on circuit in realization test diagnosis. A short circuit approach of the testing experiments organization with active analog circuits with partly inaccessible nodes is considered.
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