Abstract
We present a novel scanning proximal probe microscope design utilizing a piezoelectric driven coarse positioning mechanism in x, y, and z, while maintaining relatively small lateral dimensions. The instrument is suitable for insertion into a Dewar. The primary purpose of this work is to develop a stable yet versatile instrument in order to meet the signal averaging limitations imposed by low signal level measurements. We have implemented a near field scanning optical microscope with this system, whose key features include simultaneous detection of reflected and transmitted signals, unique “center of mass” tip oscillator for shear force feedback, and overall microscope stability.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
